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Automated Test Systems

All necessary elements brought together to test a UUT.

See Also: Testbeds, ATE


Showing results: 136 - 150 of 308 items found.

  • CCD Spectroradiometer

    LMS-8000A/LMS-8000 - Lisun Electronics Inc.

    LMS-8000A/LMS-8000 LED Measurement System is an automated measurement system for identifying the performance of individual LED. It is designed to have a capability of producing any visible spectral distribution, mimicking various light sources in the visible region by feedback control of the radiant power emitted by individual LEDs. This LED test system will be used as a transfer standard for photometric, colorimetric and radiometric applications.

  • microLED Testing System

    OmniPix-ML1000 - InZiv

    The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.

  • In-Circuit Testers

    Acculogic, Inc.

    Whether you’re choosing from our stand-alone manually loaded ICT tester all the way to our fully automatic In-line test system, Acculogic has the solution for you!Acculogic’s Scorpion family of automated test equipment and in-circuit fixture-based testers were created with one underlining theme in mind: “Cost-effective Testing”.

  • PXI Programmable Power Supply

    NI

    PXI Programmable Power Supply modules feature multiplechannels that you can combine for higher voltage or current capabilities. Some modules include isolatedchannels and an output disconnect functionality that allows isolation from the device under test(DUT) when not in use and remote sense to correct for losses in system wiring. You can use these models to simplify the task of designing automated test systems for a wide range of applicationsfrom aerospace and defense to automotive and component testby eliminating the need to mix multiple instrumentation form factors in a given test system.

  • Measurement and Analytics Solutions

    LXinstruments GmbH

    Based on our OTP² system platform, we were able to implement a family of scalable test systems which is based on a common systems architecture, e. g. for products in the area of chemical analytics measurement. We not only implemented a universal, extremely comprehensive test system, but also a series of compact systems for benchtop placement which are fully compatible with the larger, universal system. Our specialized self-test adapters and test software enable fast verification of the test systems as well as partly automated calibration by the customer.Our systems are also used in electrical measurement applications, e. g. for calibrating analog input assemblies for PLC technology. For this purpose, specialized calibrators are integrated into the system; they provide traceable calibration of the relevant stimulus signals.

  • Non-Destructive Resonant Inspection Drop Test Fixture

    RAM-DROP - The Modal Shop, Inc.

    The Drop Test Fixture, Model RAM-DROP, Resonant Inspection System, allows automated sorting and quality testing of small metal injection molded (MIM), powder injection molded (PIM), additively manufactured, and other small parts by using the Resonant Acoustic Method (NDT-RAM).

  • Digital Acquisition Benchtop System

    Keysight Technologies

    Reliable and repeatable switching is critical for your measurement accuracy whether you use switching to route signals for design verification applications or for complex automated functional test systems. Keysight's switch measure mainframe and modules help ensure confidence in your measurement results.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope

    780319-02 - NI

    1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope

    780319-03 - NI

    1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope

    780319-01 - NI

    1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • Multi-Purpose Brake Dynamometers

    GIANT 6000 Series - HORIBA, Ltd.

    The GIANT 6x00 product line is a multi-purpose, full-size inertia brake dynamometer for performance and NVH tests of brake systems from passenger vehicles to truck brakes, commercial vehicle assemblies and high-speed railway applications. The GIANT 6x00 product line offers a complete range of test functions for fully automated performance tests and basic NVH investigations and can be designed to fit the requirements of our customers.

  • Test Stand Auxiliary Power Plant Stationary System

    ViTec Co. Ltd

    The automated control system based on the measuring system implements the following main functions:control and management of the units of the test stand;measurement and recording of parameters related to the APU tests and characterizing the operation of the test bed units;blocking the start and emergency stop of the APU in accordance with the specified conditions;control of calibration / calibration processes of metering channels and calculation of metrological characteristics in accordance with verification methods;formation of text test reports;the formation of graphic protocols;the formation of an archive of test reports, graphical protocols for changing parameters during testing, and calibration / calibration protocols for measuring channels.

  • ATE System Power Supplies

    Keysight Technologies

    For more than 50 years, Keysight's automated test equipment (ATE) power supplies have changed the way engineers prove their designs, understand issues, and ensure product quality. Our programmable ATE system power supplies' compact design makes it easy to integrate them into any system. Keysight power supplies make it easy to update a test program with modern interfaces, LXI-core capability, and SCPI language. Accelerate test time with fast command processing and quick settling times.

  • Brake Testing

    Dewesoft d.o.o.

    Vehicle Brake Test and ABS TestingWe offer an easy-to-use measurement system for brake testing and ABS testing according to ECE, ISO, FMSSV, and SAE international standards. Our test system offers automated workflow, is flexible and robust and used for brake R&D, brake comfort and vehicle testing with regenerative braking. High-accuracy GPS and IMU hardware are available to achieve the highest possible velocity and distance accuracy.

  • Android Testing Framework

    UI Automator - Android Developers

    The UI Automator testing framework provides a set of APIs to build UI tests that perform interactions on user apps and system apps. The UI Automator APIs allows you to perform operations such as opening the Settings menu or the app launcher in a test device. The UI Automator testing framework is well-suited for writing black box-style automated tests, where the test code does not rely on internal implementation details of the target app.

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